共 50 条
- [42] Theory of paraxial lateral aberrations of electrostatic imaging electrostatic electron optics based on asymptotic solutions and its verification [J]. OPTIK, 2011, 122 (04): : 300 - 306
- [43] Measuring interface electrostatic potential and surface charge in a scanning electron microscope [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2009, 27 (06): : 2357 - 2360
- [46] Nanomanipulation System for Scanning Electron Microscope [J]. SCANNING MICROSCOPIES 2012: ADVANCED MICROSCOPY TECHNOLOGIES FOR DEFENSE, HOMELAND SECURITY, FORENSIC, LIFE, ENVIRONMENTAL, AND INDUSTRIAL SCIENCES, 2012, 8378
- [47] On the geometrical aberrations in electrostatic biprisms [J]. Optik (Stuttgart), 1992, 92 (01):
- [48] ABERRATIONS OF TRANSAXIAL ELECTROSTATIC LENSES [J]. SOVIET PHYSICS TECHNICAL PHYSICS-USSR, 1971, 16 (02): : 244 - +
- [49] OBJECTIVE APERTURE SYSTEM FOR THE ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1947, 18 (06) : 588 - 589