LAYERED SYNTHETIC MICROSTRUCTURES AS BRAGG DIFFRACTORS FOR X-RAYS AND EXTREME ULTRAVIOLET - THEORY AND PREDICTED PERFORMANCE

被引：331

作者：

UNDERWOOD, JH ^{[1
]}

BARBEE, TW ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT MAT SCI & ENGN,STANFORD,CA 94305

来源：

APPLIED OPTICS | 1981年 / 20卷 / 17期

关键词：

D O I：

10.1364/AO.20.003027

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：3027 / 3034

页数：8

共 21 条

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