REFLECTION AND TRANSMISSION SECONDARY EMISSION FROM SILICON

被引:39
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MARTINEL.RU
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10.1063/1.1653414
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O59 [应用物理学];
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页码:313 / &
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[1]   APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J].
FARNSWORTH, HE ;
SCHLIER, RE ;
GEORGE, TH ;
BURGER, RM .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) :1150-1161
[2]   INFRARED PHOTOEMISSION FROM SILICON [J].
MARTINELLI, RU .
APPLIED PHYSICS LETTERS, 1970, 16 (07) :261-+