THE ATOMIC-STRUCTURE OF TWIN BOUNDARIES IN RUTILE

被引：42

作者：

LEE, WY

BRISTOWE, PD

GAO, Y

MERKLE, KL

机构：

[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439

[2] NEW MEXICO INST MIN & TECHNOL,DEPT MAT ENGN,SOCORRO,NM 87801

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1993年 / 68卷 / 05期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1080/09500839308242908

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The equilibrium atomic structure of the (101) and (301) twin boundaries in rutile (TiO2) has been computed using an ionic shell model and compared with high resolution electron microscopy images of the same boundaries using image simulation. The lowest-energy (101) twin boundary structure is characterized by an in-plane translation of 1/2<111> which conserves the mirror symmetry of the metal sublattice but which imposes a displacement on the oxygen sublattice. The lowest-energy (301) twin-boundary structure involves no in-plane translation and is characterized by mirror symmetry of both the metal and the oxygen sublattices. The computed mirror symmetry of the metal sublattice for both twin boundaries is in agreement with the electron microscopy observations. A small distortion present in the simulated images is discussed in terms of the interatomic potential used in the calculations.

引用

页码：309 / 314

页数：6

共 9 条

[1] RECENT STUDIES USING STATIC SIMULATION TECHNIQUES [J].

CATLOW, CRA ;

FREEMAN, CM ;

ROYLE, RL .

PHYSICA B & C, 1985, 131 (1-3) :1-12

[2] STUDY OF DEFECTS AND INTERFACES ON THE ATOMIC SCALE IN EPITAXIAL TIO2 THIN-FILMS ON SAPPHIRE [J].

GAO, Y ;

MERKLE, KL ;

CHANG, HL ;

ZHANG, TJ ;

LAM, DJ .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1992, 65 (05) :1103-1125

[3]

HARDING JH, 1988, AERER13127 HARW REP

[4]

IWANAGA H, 1988, PHILOS MAG A, V56, P683

[5] QUANTIFICATION OF ATOMIC-SCALE GRAIN-BOUNDARY PARAMETERS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].

MERKLE, KL .

ULTRAMICROSCOPY, 1992, 40 (03) :281-290

[6]

MULHERAN PA, 1993, MODELLING SIMUL MATE, V1, P39

[7] EMS - A SOFTWARE PACKAGE FOR ELECTRON-DIFFRACTION ANALYSIS AND HREM IMAGE SIMULATION IN MATERIALS SCIENCE [J].

STADELMANN, PA .

ULTRAMICROSCOPY, 1987, 21 (02) :131-145

[8] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF LATTICE-DEFECTS IN TIO2 AND SNO2 [J].

SUZUKI, K ;

ICHIHARA, M ;

TAKEUCHI, S .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1991, 63 (04) :657-665

[9]

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