43-M PHOTOREFRACTIVE MATERIALS IN ENERGY-TRANSFER EXPERIMENTS

被引:27
作者
FABRE, JC
JONATHAN, JMC
ROOSEN, G
机构
[1] Centre Univ, Orsay, Fr, Centre Univ, Orsay, Fr
关键词
CRYSTALS - Measurements - SEMICONDUCTING GALLIUM ARSENIDE;
D O I
10.1016/0030-4018(88)90162-9
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The photorefractive effect in 43 m crystals shows specific symmetries in its dependence upon wave polarizations and crystal orientation. Theoretical predictions and experimental verification in semi-insulating gallium arsenide in the nanosecond regime at 1. 06 mu m given.
引用
收藏
页码:257 / 260
页数:4
相关论文
共 8 条
[1]   INVESTIGATION OF THE PHOTOREFRACTIVE BEHAVIOR OF CHROME-DOPED GAAS BY USING 2-BEAM COUPLING [J].
ALBANESE, G ;
KUMAR, J ;
STEIER, WH .
OPTICS LETTERS, 1986, 11 (10) :650-652
[2]   PHOTOREFRACTIVE EFFECTS AND LIGHT-INDUCED CHARGE MIGRATION IN BARIUM-TITANATE [J].
FEINBERG, J ;
HEIMAN, D ;
TANGUAY, AR ;
HELLWARTH, RW .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (03) :1297-1305
[3]   4-WAVE MIXING IN SEMI-INSULATING INP AND GAAS USING THE PHOTOREFRACTIVE EFFECT [J].
GLASS, AM ;
JOHNSON, AM ;
OLSON, DH ;
SIMPSON, W ;
BALLMAN, AA .
APPLIED PHYSICS LETTERS, 1984, 44 (10) :948-950
[4]   BEAM COUPLING IN UNDOPED GAAS AT 1.06-MU-M USING THE PHOTOREFRACTIVE EFFECT [J].
KLEIN, MB .
OPTICS LETTERS, 1984, 9 (08) :350-352
[5]   HOLOGRAPHIC STORAGE IN ELECTROOPTIC CRYSTALS .1. STEADY-STATE [J].
KUKHTAREV, NV ;
MARKOV, VB ;
ODULOV, SG ;
SOSKIN, MS ;
VINETSKII, VL .
FERROELECTRICS, 1979, 22 (3-4) :949-960
[6]   DETERMINATIONS OF THE PHOTOREFRACTIVE PARAMETERS OF BI12GEO20 CRYSTALS USING TRANSIENT GRATING ANALYSIS [J].
PAULIAT, G ;
COHENJONATHAN, JM ;
ALLAIN, M ;
LAUNAY, JC ;
ROOSEN, G .
OPTICS COMMUNICATIONS, 1986, 59 (04) :266-271
[7]   OPTICAL EVIDENCE OF A PHOTOREFRACTIVE EFFECT DUE TO HOLES IN BI12GEO20 CRYSTALS [J].
PAULIAT, G ;
ALLAIN, M ;
LAUNAY, JC ;
ROOSEN, G .
OPTICS COMMUNICATIONS, 1987, 61 (05) :321-324
[8]   PICOSECOND PHOTOREFRACTIVE BEAM COUPLING IN GAAS [J].
VALLEY, GC ;
SMIRL, AL ;
KLEIN, MB ;
BOHNERT, K ;
BOGGESS, TF .
OPTICS LETTERS, 1986, 11 (10) :647-649