THEORY OF DIFFUSION CONSTANT RECOMBINATION, LIFETIME RECOMBINATION AND SURFACE RECOMBINATION VELOCITY - MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE

被引：28
作者：
KAMM, JD [1 ]
BERNT, H [1 ]
机构：
[1] INST FESTKORPER TECHNOL,D-8000 MUNCHEN 60,FED REP GER
来源：
SOLID-STATE ELECTRONICS | 1978年 / 21卷 / 07期
关键词：
D O I：
10.1016/0038-1101(78)90294-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：957 / 964
页数：8
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