SINGLE-CRYSTAL, OPTICAL INTERFERENCE FILTERS AND INTEGRATED HIGH REFLECTOR PHOTODIODE USING MULTILAYERS OF GAP AND GAASXP1-X

被引:12
作者
GOURLEY, PL
BIEFELD, RM
ZIPPERIAN, TE
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D O I
10.1063/1.97619
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O59 [应用物理学];
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页码:242 / 244
页数:3
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共 9 条
[1]  
BIEFELD RM, 1983, JUN EL MAT C BURL, P60
[2]   INTERFACIAL SHARPNESSES AND THICKNESSES OF LAYERS IN A GAAS0.2P0.8/GAP STRAINED-LAYER SUPERLATTICE MEASURED BY AUGER SPUTTER PROFILING [J].
CHAMBERLAIN, MB ;
WALLACE, WO .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (06) :2596-2599
[4]  
GOURLEY PL, UNPUB
[5]  
GUENTHER KH, 1976, APPL OPTICS, V15, P2992, DOI 10.1364/AO.15.002992
[6]  
MACLEOD HA, 1969, THIN FILM OPTICAL FI, pCH5
[7]   DEFECTS IN EPITAXIAL MULTILAYERS .1. MISFIT DISLOCATIONS [J].
MATTHEWS, JW ;
BLAKESLEE, AE .
JOURNAL OF CRYSTAL GROWTH, 1974, 27 (DEC) :118-125
[8]  
OSBOURN GC, SEMICONDUCTORS SEMIM
[9]  
PIKHTIN AN, 1980, SOV PHYS SEMICOND+, V14, P389