共 9 条
[1]
BIEFELD RM, 1983, JUN EL MAT C BURL, P60
[2]
INTERFACIAL SHARPNESSES AND THICKNESSES OF LAYERS IN A GAAS0.2P0.8/GAP STRAINED-LAYER SUPERLATTICE MEASURED BY AUGER SPUTTER PROFILING
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1985, 3 (06)
:2596-2599
[4]
GOURLEY PL, UNPUB
[5]
GUENTHER KH, 1976, APPL OPTICS, V15, P2992, DOI 10.1364/AO.15.002992
[6]
MACLEOD HA, 1969, THIN FILM OPTICAL FI, pCH5
[8]
OSBOURN GC, SEMICONDUCTORS SEMIM
[9]
PIKHTIN AN, 1980, SOV PHYS SEMICOND+, V14, P389