DESIGN, FABRICATION, AND CHARACTERIZATION OF A HOT-ELECTRON VACUUM TRANSISTOR

被引:0
作者
KLEMER, DP [1 ]
CHEN, CY [1 ]
SHIEH, TJ [1 ]
PUJARA, M [1 ]
机构
[1] IND TECHNOL RES INST,DIV MICROELECTR PROC TECHNOL,HSINCHU 310,TAIWAN
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 02期
关键词
D O I
10.1116/1.586874
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The design and fabrication of a vacuum transistor is described which uses hot-electron emission through a thin Schottky metallization as a source of electrons for current flow. A thin titanium metallization on p-type ion-implanted gallium arsenide is used to form a Schottky contact. Application of a reverse bias greater than the avalanche breakdown voltage results in the generation of hot-electrons which are extracted by a collector metallization suspended above the Schottky metal. The collector is fabricated using a standard air-bridge fabrication process which is compatible with standard GaAs monolithic microwave integrated circuit technology. Measurements on fabricated prototype devices confirm a collector current which can be modulated by varying the potential applied to the Schottky metallization and consequently the resulting hot-electron generation. Small-signal modeling suggests that the device can be used for voltage and power gain, although the required load resistances are high for the first-generation prototype devices. This transistor may find application as a high-speed amplifier or in switching circuits for display applications.
引用
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页码:418 / 421
页数:4
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