NEW METHOD FOR DETERMINING OPTICAL-CONSTANTS BY ANGULAR MODULATION OF REFLECTANCE

被引：7
作者：
BALZAROTTI, A
PICOZZI, P
SANTUCCI, S
机构：
[1] UNIV ROME, IST FIS, ROME, ITALY
[2] UNIV AQUILA, IST FIS, AQUILA, ITALY
来源：
SURFACE SCIENCE | 1973年 / 37卷 / 01期
关键词：
D O I：
10.1016/0039-6028(73)90385-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：994 / 1001
页数：8
相关论文
共 6 条
[1]  
HEAVENS OS, 1964, PHYSICS THIN FILMS, V2
[2]   COMPARISON OF REFLECTION METHODS FOR MEASURING OPTICAL CONSTANTS WITHOUT POLARIMETRIC ANALYSIS, AND PROPOSAL FOR NEW METHODS BASED ON BREWSTER ANGLE [J].
HUMPHREYS, S .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1961, 77 (497) :949-&
[3]  
HUNDERI O, 1972, APPL OPTICS, V2, P1573
[4]   OPTICAL PROPERTIES OF GEO2 IN ULTRAVIOLET REGION [J].
PAJASOVA, L .
CZECHOSLOVAK JOURNAL OF PHYSICS, 1969, 19 (10) :1265-&
[5]   OPTICAL CONSTANTS OF SILICON IN THE REGION 1 TO 10 EV [J].
PHILIPP, HR ;
TAFT, EA .
PHYSICAL REVIEW, 1960, 120 (01) :37-38
[6]   OPTICAL CONSTANTS OF GERMANIUM IN SPECTRAL REGION FROM 0.5 EV TO 3.0 EV [J].
POTTER, RF .
PHYSICAL REVIEW, 1966, 150 (02) :562-&
1