CONTRAST AND RESOLUTION OF SECONDARY-ELECTRON IMAGES IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：0

作者：

LIU, J ^{[1
]}

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

SCANNING MICROSCOPY | 1988年 / 2卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：1957 / 1970

页数：14

共 50 条

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