CONTRAST AND RESOLUTION OF SECONDARY-ELECTRON IMAGES IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：0

|

作者：

LIU, J ^{[1
]}

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

SCANNING MICROSCOPY | 1988年 / 2卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：1957 / 1970

页数：14

相关论文

共 50 条

[21] PHASE-CONTRAST IMAGING USING A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
BUTLER, JH
COWLEY, JM
ULTRAMICROSCOPY, 1984, 12 (1-2) : 39 - 50
[22] SCANNING-TRANSMISSION ELECTRON-MICROSCOPE AS AN ANALYTICAL INSTRUMENT
ISAACSON, M
JOM-JOURNAL OF METALS, 1976, 28 (12): : A18 - A18
[23] SPECIAL LECTURE - SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
KOMODA, T
JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (01): : 85 - 85
[24] DESIGN OF AN ELECTRON SPECTROMETER FOR SCANNING-TRANSMISSION ELECTRON-MICROSCOPE (STEM)
TANG, TT
SCANNING ELECTRON MICROSCOPY, 1982, : 39 - 50
[25] PARALLEL RECORDING FOR AN ELECTRON SPECTROMETER ON A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
BERGER, SD
MCMULLAN, D
ULTRAMICROSCOPY, 1989, 28 (1-4) : 122 - 125
[26] HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPE AT JOHNS HOPKINS
WIGGINS, JW
ZUBIN, JA
BEER, M
REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (04): : 403 - 410
[27] IMPROVED SPATIAL-RESOLUTION MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
FAULKNER, RG
HOPKINS, TC
NORRGARD, K
X-RAY SPECTROMETRY, 1977, 6 (02) : 73 - 79
[28] CONTRAST IN TRANSMISSION SCANNING ELECTRON-MICROSCOPE
KANAYA, K
NISHIKOR.Y
JOURNAL OF ELECTRON MICROSCOPY, 1972, 21 (03): : 206 - 206
[29] IMAGE SIMULATION FOR SECONDARY-ELECTRON MICROGRAPHS IN THE SCANNING ELECTRON-MICROSCOPE
JOY, DC
SCANNING MICROSCOPY, 1988, 2 (01) : 57 - 64
[30] CONTRAST IN HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPE IMAGES
JOY, DC
JOURNAL OF MICROSCOPY-OXFORD, 1991, 161 : 343 - 355

← 1 2 3 4 5 →