CONTRAST AND RESOLUTION OF SECONDARY-ELECTRON IMAGES IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：0
作者：
LIU, J [1 ]
COWLEY, JM [1 ]
机构：
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
来源：
SCANNING MICROSCOPY | 1988年 / 2卷 / 04期
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D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：1957 / 1970
页数：14
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