CONTRAST AND RESOLUTION OF SECONDARY-ELECTRON IMAGES IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE

被引：0

作者：

LIU, J ^{[1
]}

COWLEY, JM ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

SCANNING MICROSCOPY | 1988年 / 2卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：1957 / 1970

页数：14

共 50 条

[11] SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE
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JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) : R1 - R18
[12] MICROANALYSIS IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
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[13] MICROANALYSIS IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
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[14] A SYSTEM TO ACQUIRE AND PROCESS SCANNING-TRANSMISSION ELECTRON-MICROSCOPE IMAGES
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[15] NATURE OF DEFOCUS FRINGES IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPE IMAGES
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[16] THE EFFECT OF ELECTRON BACKSCATTERING ON CONTRAST FORMATION IN THE SECONDARY-ELECTRON PRODUCED IN THE SCANNING ELECTRON-MICROSCOPE
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[17] AN IMAGING SECONDARY-ELECTRON DETECTOR FOR THE SCANNING ELECTRON-MICROSCOPE
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RIEKE, U
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[18] SECONDARY-ELECTRON DETECTOR FOR SHIELDED SCANNING ELECTRON-MICROSCOPE
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[19] SCANNING-TRANSMISSION ELECTRON-MICROSCOPE INTRODUCED IN BERLIN
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[20] MASS MAPPING WITH THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
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