INDUCTIVE MEASUREMENTS OF CRITICAL CURRENT-DENSITY IN SUPERCONDUCTING THIN-FILMS

被引:23
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CLAASSEN, JH
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10.1109/20.92753
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:2233 / 2236
页数:4
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共 6 条
[1]  
ALLEN LH, PHYSICAL REV B
[2]  
CAMPBELL AM, 1972, ADV PHYS, V21, P299
[3]  
FIORI AT, PENETRATION DEPTHS H
[4]   TEMPERATURE DEPENDENCE OF CRITICAL CURRENT DENSITY IN SUPERCONDUCTING TIN THIN FILMS [J].
MERCEREAU, JE ;
CRANE, LT .
PHYSICAL REVIEW LETTERS, 1962, 9 (09) :381-&
[5]   CRITICAL CURRENTS IN SUPERCONDUCTING TIN AND INDIUM [J].
SCHARNHORST, P .
PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (11) :4295-+
[6]   GIANT FLUX CREEP AND IRREVERSIBILITY IN AN Y-BA-CU-O CRYSTAL - AN ALTERNATIVE TO THE SUPERCONDUCTING-GLASS MODEL [J].
YESHURUN, Y ;
MALOZEMOFF, AP .
PHYSICAL REVIEW LETTERS, 1988, 60 (21) :2202-2205