We demonstrate two methods to induce lateral band gap modulation in buried Si1-xGex/Si quantum well structures (QWs). The basic feature of the first one is to utilize the generation of inhomogeneous strain field due to two-dimensional to three-dimensional growth mode transition of SiGe/Si heterostructures in gas-source molecular beam epitaxy. The second one is to grow SiGe/Si QWs directly on artificially-v-grooved Si substrates. The both were found to be useful for inducing lateral band gap modulation as evidenced by photoluminescence spectroscopy.