POLYCRYSTAL SCATTERING TOPOGRAPHY

被引：28

作者：

CHIKAURA, Y

YONEDA, Y

HILDEBRANDT, G

机构：

[1] MAX PLANCK GESELL,FRITZ HABER INST,D-1000 BERLIN 33,FED REP GER

[2] KYUSHU UNIV,DEPT APPL PHYS,HIGASHI KU,FUKUOKA 812,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1982年 / 15卷 / FEB期

关键词：

D O I：

10.1107/S0021889882011339

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：48 / 54

页数：7

共 15 条

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[8] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J].

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