ELLIPSOMETRIC MEASUREMENTS ON THIN ORGANIC FILMS

被引：0
|
作者：
ALLEN, TH [1 ]
机构：
[1] MCDONNELL AIRCRAFT CO,ENGN LABS,ST LOUIS,MO 63166
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1972年 / 62卷 / 11期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：1375 / 1375
页数：1
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