CHEMICAL-BOND AND RELATED PROPERTIES OF SIO2 .8. EXPERIMENTAL AND THEORETICAL INVESTIGATION OF THE STRUCTURE OF SIOX

被引：23
作者：
ENGELKE, R
ROY, T
NEUMANN, HG
HUBNER, K
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 65卷 / 01期
关键词：
D O I：
10.1002/pssa.2210650132
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：271 / 280
页数：10
相关论文
共 28 条
[1]   A STUDY OF AMORPHOUS SIO [J].
BRADY, GW .
JOURNAL OF PHYSICAL CHEMISTRY, 1959, 63 (07) :1119-1120
[2]   THE STABILITY OF SIO SOLID AND GAS [J].
BREWER, L ;
EDWARDS, RK .
JOURNAL OF PHYSICAL CHEMISTRY, 1954, 58 (04) :351-358
[3]   VACUUM UV PHOTOELECTRON-SPECTRUM OF SIO(X1 SIGMA-+) MOLECULE [J].
COLBOURN, EA ;
DYKE, JM ;
LEE, EPF ;
MORRIS, A ;
TRICKLE, IR .
MOLECULAR PHYSICS, 1978, 35 (03) :873-882
[4]   STRUCTURE OF SILICON OXIDE FILMS [J].
COLEMAN, MV ;
THOMAS, DJD .
PHYSICA STATUS SOLIDI, 1967, 22 (02) :593-&
[5]   STRUCTURAL MODELS FOR AMORPHOUS-SEMICONDUCTORS AND INSULATORS [J].
CONNELL, GAN ;
LUCOVSKY, G .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 31 (1-2) :123-155
[6]  
FUSCHILLO N, 1965, J APPL PHYS, V36, P574
[7]   ELECTRON-DIFFRACTION STUDY OF AMORPHOUS SILICON-OXIDE FILMS [J].
GEORGE, CF ;
DANTONIO, P .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (03) :323-334
[8]  
GRACZYK JF, 1976, PHYSICS STRUCTURALLY, P7
[9]   REVISED PARAMETERS OF ANALYTIC FITS FOR COHERENT AND INCOHERENT SCATTERED X-RAY INTENSITIES OF FIRST 36 ATOMS [J].
HAJDU, F .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1972, 28 (03) :250-&
[10]   CHEMICAL-BOND AND RELATED PROPERTIES OF SIO2 .7. STRUCTURE AND ELECTRONIC PROPERTIES OF THE SIOX REGION OF SI-SIO2 INTERFACES [J].
HUBNER, K .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 61 (02) :665-673
123