ANOMALOUS X-RAY-LINE BROADENING OBSERVED IN GAMMA-FE2O3 DERIVED FROM GAMMA-FEOOH

被引：16

作者：

NAKAJIMA, K

HIROTSU, Y

OKAMOTO, S

机构：

[1] Faculty of Engineering, Technological University of Nagaoka, Niigata, 940-21, Nagaoka

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1987年 / 70卷 / 05期

关键词：

D O I：

10.1111/j.1151-2916.1987.tb05001.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Defect structure of fine‐grained γ‐Fe2O3 powder obtained by dehydroxylation of y‐FeOOH powder has been studied by X‐ray diffraction and high‐resolution electron micrographs. An anomalous X‐ray line broadening was observed in the γ‐Fe2O3 powder. It is found that the X‐ray line breadth is dependent on the crystal structure factors of each reflection line: the reflections from net planes consisting of only metal ions on tetrahedral sites and octahedral sites of spinel structure are much broader than those from net planes including oxygen ions. The anomalous X‐ray line broadening is explained on the basis of stacking faults in the spinel structure. Copyright © 1987, Wiley Blackwell. All rights reserved

引用

页码：321 / 322

页数：2

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