REFLECTION CORRECTION FOR HIGH-ACCURACY TRANSMITTANCE MEASUREMENTS ON FILTER GLASSES

被引：7

作者：

MIELENZ, KD ^{[1
]}

MAVRODINEANU, R ^{[1
]}

机构：

[1] NBS, INST MAT RES, WASHINGTON, DC 20234 USA

来源：

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY | 1973年 / A 77卷 / 06期

关键词：

LIGHT; -; Reflection;

D O I：

10.6028/jres.077A.041

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Multiple reflections in the sample compartment of a spectrophotometer constitute a source of systematic bias in transmittance measurements on filter glasses. This bias may be removed by applying a numerical correction obtained from measurements on tilted samples in polarized light. For a high-accuracy spectrophotometer, this correction was found to be of the order of several 10** minus **4 transmittance units, independent of polarization, but slightly wavelength dependent.

引用

页码：699 / 703

页数：5

共 5 条

[1] TRANSMISSION MEASUREMENTS WITH THE BECKMAN QUARTZ SPECTROPHOTOMETER
GIBSON, KS
BALCOM, MM
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1947, 38 (06): : 601 - 616
[2] ANOMALIES IN EXTINCTION COEFFICIENT MEASUREMENTS
GOLDRING, LS
HAWES, RC
HARE, GH
BECKMAN, AO
STICKNEY, ME
[J]. ANALYTICAL CHEMISTRY, 1953, 25 (06) : 869 - 878
[3] ACCURATE SPECTROPHOTOMETER FOR MEASURING TRANSMITTANCE OF SOLID AND LIQUID MATERIALS
MAVRODINEANU, R
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1972, A 76 (05): : 405 - 425
[4] NEW REFERENCE SPECTROPHOTOMETER
MIELENZ, KD
ECKERLE, KL
MADDEN, RP
READER, J
[J]. APPLIED OPTICS, 1973, 12 (07): : 1630 - 1641
[5] PHYSICAL PARAMETERS IN HIGH-ACCURACY SPECTROPHOTOMETRY
MIELENZ, KD
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1972, A 76 (05): : 455 - 467

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