共 174 条
[71]
HOFFMAN DW, 1975, SURF SCI, V50, P29, DOI 10.1016/0039-6028(75)90171-5
[72]
ANALYTIC CORRECTION OF EDGE EFFECTS IN ION-BEAM SPUTTERED DEPTH PROFILES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980, 17 (02)
:613-620
[73]
Hofmann S., 1980, Surface and Interface Analysis, V2, P148, DOI 10.1002/sia.740020406
[76]
CHARACTERIZATION OF ELECTRONIC DEVICES AND MATERIALS BY SURFACE-SENSITIVE ANALYTICAL TECHNIQUES
[J].
APPLICATIONS OF SURFACE SCIENCE,
1980, 4 (3-4)
:410-444
[77]
HOLLOWAY PH, 1980, ADV ELECTRON EL PHYS, V54, P241
[78]
ISHITANI T, 1975, APPL PHYS, V6, P241, DOI 10.1007/BF00883758
[80]
Jacobsson R., 1975, PHYS THIN FILMS, V8, P51