NON-OPTICAL CHARACTERIZATION OF OPTICAL COATINGS

被引:20
作者
GUENTHER, KH
机构
来源
APPLIED OPTICS | 1981年 / 20卷 / 20期
关键词
D O I
10.1364/AO.20.003487
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:3487 / 3502
页数:16
相关论文
共 174 条
[71]  
HOFFMAN DW, 1975, SURF SCI, V50, P29, DOI 10.1016/0039-6028(75)90171-5
[72]   ANALYTIC CORRECTION OF EDGE EFFECTS IN ION-BEAM SPUTTERED DEPTH PROFILES [J].
HOFFMAN, DW ;
TSONG, IST ;
POWER, GL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (02) :613-620
[73]  
Hofmann S., 1980, Surface and Interface Analysis, V2, P148, DOI 10.1002/sia.740020406
[74]   SURFACE AND THIN-FILM ANALYSIS - CONCEPTS, CAPABILITIES AND LIMITATIONS [J].
HOFMANN, S .
TALANTA, 1979, 26 (08) :665-673
[75]   DEPTH RESOLUTION IN SPUTTER PROFILING [J].
HOFMANN, S .
APPLIED PHYSICS, 1977, 13 (02) :205-207
[76]   CHARACTERIZATION OF ELECTRONIC DEVICES AND MATERIALS BY SURFACE-SENSITIVE ANALYTICAL TECHNIQUES [J].
HOLLOWAY, PH ;
MCGUIRE, GE .
APPLICATIONS OF SURFACE SCIENCE, 1980, 4 (3-4) :410-444
[77]  
HOLLOWAY PH, 1980, ADV ELECTRON EL PHYS, V54, P241
[78]  
ISHITANI T, 1975, APPL PHYS, V6, P241, DOI 10.1007/BF00883758
[79]   EVAPORATED INHOMOGENEOUS THIN FILMS [J].
JACOBSSON, R ;
MARTENSSON, JO .
APPLIED OPTICS, 1966, 5 (01) :29-+
[80]  
Jacobsson R., 1975, PHYS THIN FILMS, V8, P51