THE USE OF CRITICAL POINT PHENOMENA IN PREPARING SPECIMENS FOR THE ELECTRON MICROSCOPE

被引：38
作者：
ANDERSON, TF
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1950年 / 21卷 / 07期
关键词：
D O I：
10.1063/1.1699746
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：724 / 724
页数：1
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