THE USE OF CRITICAL POINT PHENOMENA IN PREPARING SPECIMENS FOR THE ELECTRON MICROSCOPE

被引：38

作者：

ANDERSON, TF

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1950年 / 21卷 / 07期

关键词：

D O I：

10.1063/1.1699746

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：724 / 724

页数：1

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