Development of Seebeck-Coefficient Measurement Systems Using Kelvin-Probe Force Microscopy

被引：2
作者：
Miwa, Kazutoshi [1 ]
Salleh, Faiz [1 ,2 ]
Ikeda, Hiroya [1 ]
机构：
[1] Shizuoka Univ, Elect Res Inst, Naka Ku, 3-5-1 Johoku, Hamamatsu, Shizuoka 4328011, Japan
[2] Japan Soc Promot Sci, Chiyoda Ku, Tokyo 1028472, Japan
来源：
MAKARA JOURNAL OF TECHNOLOGY | 2013年 / 17卷 / 01期
关键词：
Fermi energy; Kelvin-probe force microscopy; Seebeck coefficient;
D O I：
10.7454/mst.v17i1.1922
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thermoelectric device is investigated by a number of researchers in order to enhance the thermoelectric efficiency. It is known that the efficiency can be improved by quantum effect. However, it is difficult to measure the thermoelectric characteristics of nanometer-scale structures. Thus a new measurement method is expected to be developed. We propose to apply Kelvin-probe force microscopy (KFM) to characterization of thermoelectric materials. KFM can locally observe surface potential of Fermi energy of a sample without touching the sample surface. In the present paper, we estimate the Seebeck coefficient of thin Si-on-insulator layers using KFM.
引用
收藏
页码：17 / 20
页数：4
相关论文
共 13 条
  • [1] Mechanism for thermoelectric figure-of-merit enhancement in regimented quantum dot superlattices
    Balandin, AA
    Lazarenkova, OL
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (03) : 415 - 417
  • [2] Silicon nanowires as efficient thermoelectric materials
    Boukai, Akram I.
    Bunimovich, Yuri
    Tahir-Kheli, Jamil
    Yu, Jen-Kan
    Goddard, William A., III
    Heath, James R.
    [J]. NATURE, 2008, 451 (7175) : 168 - 171
  • [3] NANOMETER-SCALE IMAGING OF POTENTIAL PROFILES IN OPTICALLY-EXCITED N-I-P-I HETEROSTRUCTURE USING KELVIN PROBE FORCE MICROSCOPY
    CHAVEZPIRSON, A
    VATEL, O
    TANIMOTO, M
    ANDO, H
    IWAMURA, H
    KANBE, H
    [J]. APPLIED PHYSICS LETTERS, 1995, 67 (21) : 3069 - 3071
  • [4] Quantum dot superlattice thermoelectric materials and devices
    Harman, TC
    Taylor, PJ
    Walsh, MP
    LaForge, BE
    [J]. SCIENCE, 2002, 297 (5590) : 2229 - 2232
  • [5] EFFECT OF QUANTUM-WELL STRUCTURES ON THE THERMOELECTRIC FIGURE OF MERIT
    HICKS, LD
    DRESSELHAUS, MS
    [J]. PHYSICAL REVIEW B, 1993, 47 (19): : 12727 - 12731
  • [6] THERMOELECTRIC FIGURE OF MERIT OF A ONE-DIMENSIONAL CONDUCTOR
    HICKS, LD
    DRESSELHAUS, MS
    [J]. PHYSICAL REVIEW B, 1993, 47 (24): : 16631 - 16634
  • [7] Enhanced thermoelectric performance of rough silicon nanowires
    Hochbaum, Allon I.
    Chen, Renkun
    Delgado, Raul Diaz
    Liang, Wenjie
    Garnett, Erik C.
    Najarian, Mark
    Majumdar, Arun
    Yang, Peidong
    [J]. NATURE, 2008, 451 (7175) : 163 - U5
  • [8] SILICON PN JUNCTION IMAGING AND CHARACTERIZATIONS USING SENSITIVITY ENHANCED KELVIN PROBE FORCE MICROSCOPY
    KIKUKAWA, A
    HOSAKA, S
    IMURA, R
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (25) : 3510 - 3512
  • [9] Measurement of Local Peltier Constant at a Microcontact
    Koyano, Mikio
    Akashi, Naoya
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2009, 38 (07) : 1037 - 1040
  • [10] ATOMIC ORDERING OF GAINP STUDIED BY KELVIN PROBE FORCE MICROSCOPY
    LENG, Y
    WILLIAMS, CC
    SU, LC
    STRINGFELLOW, GB
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (10) : 1264 - 1266
12