STUDY OF THE SI(111)7X7 SURFACE BY RHEED ROCKING CURVE ANALYSIS

被引:45
|
作者
HANADA, T [1 ]
INO, S [1 ]
DAIMON, H [1 ]
机构
[1] UNIV TOKYO,FAC SCI,DEPT PHYS,BUNKYO KU,TOKYO 113,JAPAN
关键词
D O I
10.1016/0039-6028(94)91162-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Several integer and fractional rocking curves of reflection high energy electron diffraction (RHEED) from the Si(111)7 x 7 surface have been measured using a SIT camera. Dynamical calculation of RHEED intensity and minimization of the reliability factor have been employed to analyze the surface-normal atomic coordinates of the dimer-adatom-stacking fault (DAS) model. The most important parameters to be in agreement with the experimental results are outward displacements of the adatoms and the rest-atoms and inward displacements of the second and third layer atoms just below an adatom. It is also demonstrated that some rocking curves are sensitive for stacking faults.
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页码:143 / 154
页数:12
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