DELAYED COINCIDENCE MEASUREMENTS USING SEMICONDUCTOR-DETECTORS

被引：1

作者：

BISHOP, RJ ^{[1
]}

机构：

[1] KINGSTON POLYTECH,SCH PHYS,KINGSTON UPON THAMES,SURREY,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS | 1974年 / 115卷 / 01期

关键词：

D O I：

10.1016/0029-554X(74)90425-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：61 / 64

页数：4

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