共 11 条
[1]
[Anonymous], 2011, JTAG BOUNDARY SCAN C
[2]
[Anonymous], 2011, FT2232H DUAL HIGH SP
[3]
[Anonymous], 2011, JTAG SCAN EDUCATOR T
[4]
[Anonymous], 2013, 114912013 IEEE, P1
[5]
[Anonymous], 2011, TRAINER 1149 TESTONI
[6]
[Anonymous], 2011, TURBO TESTER
[7]
Crosier D., 2007, TREDNS V U SHAPING E, P97
[8]
Jutman A., 2005, IEEE EUR BOARS TEST
[9]
Jutman Artur, 2004, P 6 INT WORKSH BOOL, P271
[10]
The International Technology Roadmap for Semiconductors, 2010, 2010 UPD TEST TEST E