VERIFICATION OF ON-WAFER NOISE PARAMETER MEASUREMENTS

被引：12
|
作者：
BOUDIAF, A [1 ]
DUBONCHEVALLIER, C [1 ]
PASQUET, D [1 ]
机构：
[1] FRANCE TELECOM,CNET,BAGNEUX LAB,F-92220 BAGNEUX,FRANCE
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1995年 / 44卷 / 02期
关键词：
D O I：
10.1109/19.377845
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Using a thin film technology, we have designed and fabricated a new passive device for noise parameter measurement test instrumentation verification. the main feature specifying this de,ice is the same order of magnitude for input-output reflection coefficients and for noise parameters, as for low-noise field effect transistors. This new device is useful as a verification artifact, suited for on-wafer measurements due to its small size and wide operation bandwidth.
引用
收藏
页码：332 / 335
页数：4
相关论文
共 50 条
  • [1] REPEATABILITY AND VERIFICATION OF ON-WAFER NOISE PARAMETER MEASUREMENTS
    FRASER, A
    STRID, E
    LEAKE, B
    BURCHAM, T
    MICROWAVE JOURNAL, 1988, 31 (11) : 172 - 176
  • [2] Repeatability and verification of on-wafer noise parameter measurements
    Fraser, Arthur
    Strid, Eric
    Leake, Bernie
    Burcham, Terry
    Microwave journal, 1988, 31 (11):
  • [3] Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements
    Chen, Chih-Hung
    Wang, Ying-Lien
    Bakr, Mohamed H.
    Zeng, Zheng
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (11) : 2462 - 2471
  • [4] On-wafer noise-parameter measurements at W-band
    Vähä-Heikkilä, T
    Lahdes, M
    Kantanen, M
    Tuovinen, J
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (06) : 1621 - 1628
  • [5] On-wafer measurements of noise temperature
    Randa, J
    Billinger, RL
    Rice, JL
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (06) : 1259 - 1269
  • [6] An Improved Cascade-Based Noise Deembedding Method for On-Wafer Noise Parameter Measurements
    Lee, Chie-In
    Lin, Wei-Cheng
    Lin, Yan-Ting
    IEEE ELECTRON DEVICE LETTERS, 2015, 36 (04) : 291 - 293
  • [7] A novel MMIC source impedance tuner for on-wafer microwave noise parameter measurements
    Collins, CE
    Pollard, RD
    Miles, RE
    MONOLITHIC CIRCUITS SYMPOSIUM, DIGEST OF PAPERS, 1996, : 123 - 126
  • [8] TRACEABILITY FOR ON-WAFER S-PARAMETER MEASUREMENTS
    BANNISTER, DJ
    PERKINS, M
    IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY, 1992, 139 (05): : 232 - 234
  • [9] Vector corrected on-wafer measurements of noise temperature
    Weatherspoon, MH
    Dunleavy, LP
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (03) : 1327 - 1332
  • [10] ACCURACY ISSUES OF ON-WAFER MICROWAVE NOISE MEASUREMENTS
    Chen, Chih-Hung
    FLUCTUATION AND NOISE LETTERS, 2008, 8 (3-4): : L281 - L303
12345