MICROWAVE AND RADIO-FREQUENCY EXPOSURE LIMITS

被引：3
作者：
HARLEN, F
机构：
[1] Nat. Radiographical Protect. Board, Chilton, Didcot, Oxon. OX11 0RQ, United Kingdom
来源：
IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY | 1981年 / 128卷 / 09期
关键词：
Engineering Village;
D O I：
10.1049/ip-a-1.1981.0089
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：589 / 592
页数：4
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