Defect Sizing and Location by Lock-in Photo-Infrared Thermography

被引：0

作者：

Choi, Manyong ^{[1
]}

Kang, Kisoo ^{[1
]}

Park, Jeonghak ^{[1
]}

Kim, Wontae ^{[1
]}

Kim, Koungsuk ^{[1
]}

机构：

[1] Korea Res Inst Stand & Sci, Safety Metrol Grp, Daejeon 305353, South Korea

来源：

JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING | 2007年 / 27卷 / 04期

关键词：

Lock-In Infrared Thermography; Defect Sizing; Defect Location; Shearing Phase Technique;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In lock-in thermography, a phase difference between the defect area and the healthy area indicates the qualitative location and size of the defect. To accurately estimate these parameters, the shearing-phase technique has been employed which gives the shearing-phase distribution. The shearing-phase distribution has maximum, minimum, and zero points that help determine quantitatively the size and location of the subsurface defect. In experiment, the proposed technique is verified with artificial specimen and these related factors are analyzed.

引用

页码：321 / 327

页数：7

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