AVALANCHING IN SINGLE-EVENT-UPSET CHARGE COLLECTION IN SEMICONDUCTOR DIODES

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作者：
WARD, AL
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IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：1552 / 1559
页数：8
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