Procedure of microwave investigations of ferroelectric films and tunable microwave devices based on ferroelectric films.

被引：70

作者：

Kozyrev, AB

Keis, VN

Koepf, G

Yandrofski, R

Soldatenkov, OI

Dudin, KA

Dovgan, DP

机构：

[1] Electrotechnical University, St.Petersburg, 197376

[2] Superconducting Core Technologies, Inc., Golden, CO 80401

来源：

MICROELECTRONIC ENGINEERING | 1995年 / 29卷 / 1-4期

关键词：

D O I：

10.1016/0167-9317(95)00156-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Measuring devices and main expressions for the procedure of measurements of the dielectric properties of ferroelectric (FE) films at microwave (MW) are presented. The results of MW measurements of SrTiO3 (STO) and Ba0.5Sr0.5TiO3 (BSTO) films demonstrate the possibilities of this procedure. Formulas required to choose the most suitable FE materials and to design the FE microwave devices (filters, phase shifters) are presented.

引用

页码：257 / 260

页数：4