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GENERATION OF SIO2 INTERFACE STATES AT LOW-TEMPERATURE WITH IONIZING IRRADIATION
被引:6
作者
:
BLUZER, N
论文数:
0
引用数:
0
h-index:
0
BLUZER, N
AFFINITO, D
论文数:
0
引用数:
0
h-index:
0
AFFINITO, D
BLAHA, FC
论文数:
0
引用数:
0
h-index:
0
BLAHA, FC
机构
:
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1981年
/ 28卷
/ 06期
关键词
:
D O I
:
10.1109/TNS.1981.4335677
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:4074 / 4079
页数:6
相关论文
共 20 条
[1]
BLUZER N, 1979, N0017378C0293 US NAV
[2]
BLUZER N, 1979, P INT ELECT DEV M WA, P629
[3]
HOLE TRANSPORT AND CHARGE RELAXATION IN IRRADIATED SIO2 MOS CAPACITORS
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
BOESCH, HE
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
MCLEAN, FB
MCGARRITY, JM
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
MCGARRITY, JM
AUSMAN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
AUSMAN, GA
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
: 2163
-
2167
[4]
EXPERIMENTAL CHARACTERIZATION OF TRANSFER EFFICIENCY IN CHARGE-COUPLED-DEVICES
BRODERSEN, RW
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
BRODERSEN, RW
BUSS, DD
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0
引用数:
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h-index:
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TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
BUSS, DD
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
TASCH, AF
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(02)
: 40
-
46
[5]
BRODERSON RW, 1978, P INT C APPL CCDS SA, P331
[6]
SI-SIO2 FAST INTERFACE STATE MEASUREMENTS
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
BROWN, DM
GRAY, PV
论文数:
0
引用数:
0
h-index:
0
GRAY, PV
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(07)
: 760
-
+
[7]
JENQ CS, 1977, THESIS PRINCETON U
[8]
DETERMINATION OF SURFACE-STATE PARAMETERS FROM TRANSFER-LOSS MEASUREMENTS IN CCDS
KRIEGLER, RJ
论文数:
0
引用数:
0
h-index:
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机构:
Bell-Northern Research, Ottawa, Ont.
KRIEGLER, RJ
DEVENYI, TF
论文数:
0
引用数:
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Bell-Northern Research, Ottawa, Ont.
DEVENYI, TF
CHIK, KD
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机构:
Bell-Northern Research, Ottawa, Ont.
CHIK, KD
SHAPPIR, J
论文数:
0
引用数:
0
h-index:
0
机构:
Bell-Northern Research, Ottawa, Ont.
SHAPPIR, J
[J].
JOURNAL OF APPLIED PHYSICS,
1979,
50
(01)
: 398
-
401
[9]
A FRAMEWORK FOR UNDERSTANDING RADIATION-INDUCED INTERFACE STATES IN SIO2 MOS STRUCTURES
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
MCLEAN, FB
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(06)
: 1651
-
1657
[10]
MOSHEN AM, 1974, IEEE T ELECTRON DEV, VED21, P701
←
1
2
→
共 20 条
[1]
BLUZER N, 1979, N0017378C0293 US NAV
[2]
BLUZER N, 1979, P INT ELECT DEV M WA, P629
[3]
HOLE TRANSPORT AND CHARGE RELAXATION IN IRRADIATED SIO2 MOS CAPACITORS
BOESCH, HE
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
BOESCH, HE
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
MCLEAN, FB
MCGARRITY, JM
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
MCGARRITY, JM
AUSMAN, GA
论文数:
0
引用数:
0
h-index:
0
机构:
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
HARRY DIAMOND LABS, ADELPHIA, MD 20782 USA
AUSMAN, GA
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1975,
22
(06)
: 2163
-
2167
[4]
EXPERIMENTAL CHARACTERIZATION OF TRANSFER EFFICIENCY IN CHARGE-COUPLED-DEVICES
BRODERSEN, RW
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
BRODERSEN, RW
BUSS, DD
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
BUSS, DD
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTR INC,DALLAS,TX 75222
TEXAS INSTR INC,DALLAS,TX 75222
TASCH, AF
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(02)
: 40
-
46
[5]
BRODERSON RW, 1978, P INT C APPL CCDS SA, P331
[6]
SI-SIO2 FAST INTERFACE STATE MEASUREMENTS
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
BROWN, DM
GRAY, PV
论文数:
0
引用数:
0
h-index:
0
GRAY, PV
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(07)
: 760
-
+
[7]
JENQ CS, 1977, THESIS PRINCETON U
[8]
DETERMINATION OF SURFACE-STATE PARAMETERS FROM TRANSFER-LOSS MEASUREMENTS IN CCDS
KRIEGLER, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
Bell-Northern Research, Ottawa, Ont.
KRIEGLER, RJ
DEVENYI, TF
论文数:
0
引用数:
0
h-index:
0
机构:
Bell-Northern Research, Ottawa, Ont.
DEVENYI, TF
CHIK, KD
论文数:
0
引用数:
0
h-index:
0
机构:
Bell-Northern Research, Ottawa, Ont.
CHIK, KD
SHAPPIR, J
论文数:
0
引用数:
0
h-index:
0
机构:
Bell-Northern Research, Ottawa, Ont.
SHAPPIR, J
[J].
JOURNAL OF APPLIED PHYSICS,
1979,
50
(01)
: 398
-
401
[9]
A FRAMEWORK FOR UNDERSTANDING RADIATION-INDUCED INTERFACE STATES IN SIO2 MOS STRUCTURES
MCLEAN, FB
论文数:
0
引用数:
0
h-index:
0
MCLEAN, FB
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(06)
: 1651
-
1657
[10]
MOSHEN AM, 1974, IEEE T ELECTRON DEV, VED21, P701
←
1
2
→