LINEAR VARIATIONS IN CONDUCTIVITY WITH THICKNESS OF THIN POLYCRYSTALLINE FILMS

被引：23

作者：

PICHARD, CR

TELLIER, CR

TOSSER, AJ

机构：

来源：

JOURNAL OF MATERIALS SCIENCE | 1980年 / 15卷 / 09期

关键词：

D O I：

10.1007/BF00552312

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：2236 / 2240

页数：5

相关论文

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[1] COTTEY AA, 1968, THIN SOLID FILMS, V4, P297
[2] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES
MAYADAS, AF
SHATZKES, M
[J]. PHYSICAL REVIEW B, 1970, 1 (04): : 1382 - &
[3] OLSEN JL, 1962, ELECTRON TRANSPORT M
[4] 3-DIMENSIONAL MODEL FOR GRAIN-BOUNDARY RESISTIVITY IN METAL-FILMS
PICHARD, CR
TELLIER, CR
TOSSER, AJ
[J]. THIN SOLID FILMS, 1979, 62 (02) : 189 - 194
[5] DECOMPOSITION OF POLYCRYSTALLINE METALLIC FILM RESISTIVITY FROM MATHIESSENS RULE
PICHARD, CR
TELLIER, CR
TOSSER, AJ
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (09) : L101 - L103
[6] THE MEAN FREE PATH OF ELECTRONS IN METALS
SONDHEIMER, EH
[J]. ADVANCES IN PHYSICS, 1952, 1 (01) : 1 - 42
[7] MAYADAS-SHATZKES CONDUCTION IN NUCLEATION-GROWN RF SPUTTERED FILMS OF ALUMINUM
TELLIER, C
TOSSER, A
[J]. THIN SOLID FILMS, 1976, 37 (02) : 207 - 214
[8] AGING PROCESSES IN THIN RADIO-FREQUENCY SPUTTERED ZINC FILMS
TELLIER, C
[J]. THIN SOLID FILMS, 1978, 51 (03) : 327 - 334
[9] NUCLEATION GROWTH OF THIN SPUTTERED ZINC FILMS
TELLIER, C
TOSSER, A
[J]. THIN SOLID FILMS, 1976, 35 (01) : 65 - 74
[10] ELECTRICAL-CONDUCTION IN THIN ZINC RF SPUTTERED FILMS
TELLIER, CR
[J]. VACUUM, 1978, 28 (8-9) : 321 - 327