WHITE BEAM SYNCHROTRON X-RAY INTERFEROMETRY

被引：5

作者：

HART, M ^{[1
]}

SAUVAGE, M ^{[1
]}

SIDDONS, DP ^{[1
]}

机构：

[1] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1980年 / 36卷 / NOV期

关键词：

D O I：

10.1107/S0567739480001969

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：947 / 951

页数：5

共 11 条

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[6] THE APPLICATION OF SYNCHROTRON RADIATION TO X-RAY INTERFEROMETRY [J].

HART, M .

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[10]

SIDDONS DP, 1979, THESIS U LONDON ENGL