DISLOCATION EMISSION FROM CRACKS - OBSERVATIONS BY X-RAY TOPOGRAPHY IN SILICON

被引：54
作者：
MICHOT, G [1 ]
GEORGE, A [1 ]
机构：
[1] UNIV PARIS 11,CNRS,LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE
来源：
SCRIPTA METALLURGICA | 1986年 / 20卷 / 11期
关键词：
D O I：
10.1016/0036-9748(86)90382-0
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
42
引用
收藏
页码：1495 / 1500
页数：6
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