HIGH-PRESSURE STUDIES ON THE ELECTRICAL-RESISTIVITY OF AS-TE GLASSES

被引：11

作者：

TITUS, SSK

ASOKAN, S

RAMAKRISHNA, R

GOPAL, ESR

机构：

[1] Instrumentation and Services Unit, Indian Institute of Science, Bangalore

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1990年 / 62卷 / 05期

关键词：

D O I：

10.1080/13642819008215252

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Electrical resistivity measurements have been performed on bulk semiconducting AsxTe100-x glasses (25≤x≤60) in a Bridgman anvil system. The resistivity of all the AsXYe100-x glassy samples decreases continuously with increasing pressure, reaching metallic values at around 5 GPa. The high-pressure response of AsxTe100_x glasses shows a very subtle change at x = 40. The observed subtle change in the high-pressure response as of AsxTe100-x glasses at x=40 can be connected with the rigidity percolation occurring at this composition. © 1990 Taylor & Francis Ltd.

引用

页码：553 / 556

页数：4

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