NEW CAVITY PERTURBATION TECHNIQUE FOR MICROWAVE MEASUREMENT OF DIELECTRIC-CONSTANT

被引：7

作者：

SEN, S

SAHA, PK

NAG, BR

机构：

[1] Institute of Radio Physics and Electronics, University College of Technology, Calcutta-700009

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1979年 / 50卷 / 12期

关键词：

D O I：

10.1063/1.1135772

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new cavity perturbation technique is presented for microwave measurement of dielectric constant, which uses a modified cylindrical reentrant cavity. Though suitable for only low dielectric constants, the method has the advantages, (a) sample area does not appear in the calculations, (b) only the ratio of frequency shifts due to two samples of same area and different thickness is involved, and (c) calibration of the measuring system with known dielectric is not necessary.

引用

页码：1594 / 1597

页数：4

共 9 条

[1]

Champlin K.S., 1961, IRE T MICROWAVE THEO, VMTT-9, P545, DOI 10.1109/TMTT.1961.1125387

[2] CAVITY PERTURBATION TECHNIQUES FOR MEASUREMENT OF MICROWAVE CONDUCTIVITY AND DIELECTRIC-CONSTANT OF A BULK SEMICONDUCTOR MATERIAL [J].