ELECTRON-SPIN-RESONANCE MEASUREMENTS OF SPIN SUSCEPTIBILITY OF HEAVILY DOPED TYPE SILICON

被引：46
作者：
QUIRT, JD
MARKO, JR
机构：
来源：
PHYSICAL REVIEW LETTERS | 1971年 / 26卷 / 06期
关键词：
D O I：
10.1103/PhysRevLett.26.318
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：318 / &
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