A FINITE-ELEMENT TECHNIQUE FOR MULTICONDUCTOR CABLE PARAMETERS CALCULATION

被引：48
作者：
CRISTINA, S [1 ]
FELIZIANI, M [1 ]
机构：
[1] UNIV ROME LA SAPIENZA,DEPT ELECT ENERGY,I-00185 ROME,ITALY
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 04期
关键词：
D O I：
10.1109/20.34346
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：2986 / 2988
页数：3
相关论文
共 12 条
[1]   A GENERAL FORMULATION OF IMPEDANCE AND ADMITTANCE OF CABLES [J].
AMETANI, A .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1980, 99 (03) :902-910
[2]   FINITE-ELEMENT METHOD APPLIED TO SKIN-EFFECT PROBLEMS IN STRIP TRANSMISSION-LINES [J].
COSTACHE, GI .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1987, 35 (11) :1009-1013
[3]   COMPUTATION OF CABLE IMPEDANCES BASED ON SUBDIVISION OF CONDUCTORS [J].
DEARIZON, P ;
DOMMEL, HW .
IEEE TRANSACTIONS ON POWER DELIVERY, 1987, 2 (01) :21-27
[4]   NEW FINITE-ELEMENT TECHNIQUES FOR SKIN EFFECT PROBLEMS [J].
KONRAD, A ;
CHARI, MVK ;
CSENDES, ZJ .
IEEE TRANSACTIONS ON MAGNETICS, 1982, 18 (02) :450-455
[5]   ADVANCES IN FINITE-ELEMENT TECHNIQUES FOR CALCULATING CABLE RESISTANCES AND INDUCTANCES [J].
LUCAS, R ;
TALUKDAR, S .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1978, 97 (03) :875-883
[6]   QUASI-TEM ANALYSIS OF MICROWAVE TRANSMISSION-LINES BY THE FINITE-ELEMENT METHOD [J].
PANTIC, Z ;
MITTRA, R .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1986, 34 (11) :1096-1103
[7]   MODELING AND MEASUREMENT OF MICROSTRIP TRANSMISSION-LINE STRUCTURES [J].
SHEPHERD, PR ;
DALY, P .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1985, 33 (12) :1501-1506
[8]   MODAL NETWORK THEORY OF SKIN EFFECT IN FLAT CONDUCTORS [J].
SILVESTER, P .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (09) :1147-+
[9]   ACCURATE CALCULATION OF SKIN EFFECT IN CONDUCTORS OF COMPLICATED SHAPE [J].
SILVESTER, P .
IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1968, PA87 (03) :735-+
[10]  
Silvester P. P, 1983, FINITE ELEMENTS ELEC
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