SOME CONSIDERATIONS IN THE FORMULATION OF IC YIELD STATISTICS - COMMENT

被引:24
作者
STAPPER, CH
机构
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D O I
10.1016/0038-1101(81)90006-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:127 / 132
页数:6
相关论文
共 12 条
[1]   IC YIELD PROBLEM - TENTATIVE ANALYSIS FOR MOS-SOS CIRCUITS [J].
BERNARD, J .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (08) :939-944
[2]  
GUPTA A, 1974, IEEE J SOLID ST CIR, V14, P96
[3]  
HU SM, 1979, SOLID STATE ELECTRON, V22, P205, DOI 10.1016/0038-1101(79)90114-X
[4]  
MAEDER RA, 1973, Patent No. 3751647
[5]   COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J].
MURPHY, BT .
PROCEEDINGS OF THE IEEE, 1964, 52 (12) :1537-&
[6]  
SEEDS RB, 1967, IEEE INT ELECTRON DE
[7]   COMPOSITE MODEL TO IC YIELD PROBLEM [J].
STAPPER, CH .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (06) :537-539
[8]   LSI YIELD MODELING AND PROCESS MONITORING [J].
STAPPER, CH .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1976, 20 (03) :228-234
[9]   YIELD MODEL FOR PRODUCTIVITY OPTIMIZATION OF VLSI MEMORY CHIPS WITH REDUNDANCY AND PARTIALLY GOOD PRODUCT [J].
STAPPER, CH ;
MCLAREN, AN ;
DRECKMANN, M .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (03) :398-409
[10]   DESIGN CONSIDERATIONS FOR INTEGRATED ELECTRONIC DEVICES [J].
WALLMARK, JT .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1960, 48 (03) :293-300