A NEW LEED INSTRUMENT FOR QUANTITATIVE SPOT PROFILE ANALYSIS

被引：238
作者：
SCHEITHAUER, U
MEYER, G
HENZLER, M
机构：
来源：
SURFACE SCIENCE | 1986年 / 178卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(86)90321-3
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：441 / 451
页数：11
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