FLUCTUATION IN 2-DIMENSIONAL STICK-SLIP PHENOMENON OBSERVED WITH 2-DIMENSIONAL FRICTIONAL FORCE MICROSCOPE

被引:26
作者
FUJISAWA, S
KISHI, E
SUGAWARA, Y
MORITA, S
机构
[1] Department of Physics, Hiroshima University, Higashi-Hiroshima
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 6B期
关键词
ATOMIC FORCE MICROSCOPE (AFM); LATERAL FORCE MICROSCOPE (LFM); FRICTIONAL FORCE; ATOMIC SCALE; ATOMICALLY FLAT SURFACE; 2-DIMENSIONAL FRICTIONAL FORCE MICROSCOPE (2D-FFM); 2-DIMENSIONAL STICK-SLIP (2D STICK-SLIP); 2-DIMENSIONAL DISCRETE JUMP;
D O I
10.1143/JJAP.33.3752
中图分类号
O59 [应用物理学];
学科分类号
摘要
We used an atomic force microscope combined with a lateral force microscope (AFM/LFM) as a two-dimensional frictional force microscope (2D-FFM) to investigate the two-dimensional behavior of the atomic-scale friction between the cleaved surface of MoS2 and the Si3N4 tip apex of the microcantilever based on the two-dimensional stick-slip model. As a result, for the scan direction along the row of the stick-points, we found the unstable state where the tip apex shows fluctuation between two adjacent rows of stick-points. On the other hand, near the row of the stick-points, we also found the stable state where the tip apex takes a straight walk on a row of the stick-points without fluctuation.
引用
收藏
页码:3752 / 3755
页数:4
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