APPLICATION OF CF-252 PLASMA DESORPTION MASS-SPECTROMETRY IN DENTAL RESEARCH

被引:3
作者
FRITSCH, HW [1 ]
SCHMIDT, L [1 ]
KOHL, P [1 ]
JUNGCLAS, H [1 ]
DUSCHNER, H [1 ]
机构
[1] UNIV MAINZ,W-6500 MAINZ,GERMANY
来源
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1993年 / 126卷
关键词
PLASMA DESORPTION MASS SPECTROMETRY; FLOURIDES; ENAMEL;
D O I
10.1016/0168-1176(93)80084-R
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Topically applied fluorides as introduced in dental hygiene products elevate the concentration levels of fluoride in oral fluids and thus also affect chemical reactions of enamel de- and remineralisation. The chemical reactions on the surface of tooth enamel still are a subject of controversy. Here Cf-252-plasma desorption mass spectrometry and argon ion etching are used to analyse the molecular structure of the upper layers of enamel. The mass spectrum of untreated enamel is characterised by a series of cluster ions containing phosphate. It is evident that under certain conditions the molecular structure of the surface enamel is completely transformed by treatment with fluorides. The result of the degradation and precipitation processes is reflected by a total replacement of the phosphate by fluoride in the measured cluster ion distribution. Stepwise etching of the upper layers by Ar+ ions reveals the transition from a nearly pure CaF2 Structure to the unchanged composition of the enamel mineral.
引用
收藏
页码:191 / 196
页数:6
相关论文
共 3 条
[1]   DEPTH PROFILES OF FLUORIDE INTERACTIONS IN HYPERFINE SUBSURFACE LAYERS OF DENTAL ENAMEL [J].
DUSCHNER, H ;
UCHTMANN, H .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1987, 327 (5-6) :484-490
[2]   ELECTRON SPECTROSCOPIC STUDIES OF INTERACTIONS BETWEEN SUPERFICIALLY-APPLIED FLUORIDES AND SURFACE ENAMEL [J].
UCHTMANN, H ;
DUSCHNER, H .
JOURNAL OF DENTAL RESEARCH, 1982, 61 (02) :423-428
[3]  
UCHTMANN H, 1983, TRACE ELEMENT ANAL C, V2, P1009