GAIN MEASUREMENT OF SEMICONDUCTOR-LASER DIODES - REQUIREMENTS FOR THE WAVELENGTH RESOLUTION AND SENSITIVITY TO NOISE

被引：16
|
作者：
JORDAN, V
机构：
[1] Technische Universitat Munchen, Munchen
来源：
IEE PROCEEDINGS-OPTOELECTRONICS | 1994年 / 141卷 / 01期
关键词：
SEMICONDUCTOR LASER DIODES; GAIN MEASUREMENT; NOISE SENSITIVITY;
D O I：
10.1049/ip-opt:19949912
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The gain-measurement methods of Hakki-Paoli and Cassidy are investigated theoretically with respect to accuracy of gain evaluation and sensitivity to noise. The Cassidy method proves to be less sensitive to noise than the Hakki-Paoli method if an additional averaging procedure is introduced. The results presented permit easy establishment of the required performance of an appropriate measurement system.
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页码：13 / 15
页数：3
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