GAIN MEASUREMENT OF SEMICONDUCTOR-LASER DIODES - REQUIREMENTS FOR THE WAVELENGTH RESOLUTION AND SENSITIVITY TO NOISE

被引：16

作者：

JORDAN, V

机构：

[1] Technische Universitat Munchen, Munchen

来源：

IEE PROCEEDINGS-OPTOELECTRONICS | 1994年 / 141卷 / 01期

关键词：

SEMICONDUCTOR LASER DIODES; GAIN MEASUREMENT; NOISE SENSITIVITY;

D O I：

10.1049/ip-opt:19949912

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The gain-measurement methods of Hakki-Paoli and Cassidy are investigated theoretically with respect to accuracy of gain evaluation and sensitivity to noise. The Cassidy method proves to be less sensitive to noise than the Hakki-Paoli method if an additional averaging procedure is introduced. The results presented permit easy establishment of the required performance of an appropriate measurement system.

引用

页码：13 / 15

页数：3

共 6 条

[1] TECHNIQUE FOR MEASUREMENT OF THE GAIN SPECTRA OF SEMICONDUCTOR DIODE-LASERS [J].