X-RAY PHOTOELECTRON-SPECTROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY STUDY OF ANION INCORPORATION IN ANODICALLY GROWN FILMS

被引：4

作者：

MAGNUSSEN, N ^{[1
]}

QUINONES, L ^{[1
]}

COCKE, DL ^{[1
]}

SCHWEIKERT, EA ^{[1
]}

PATNAIK, BK ^{[1
]}

LEITE, CVB ^{[1
]}

BAPTISTA, GB ^{[1
]}

机构：

[1] PONTIFICIA UNIV CATOLICA RIO DE JANEIRO,DEPT FIS,BR-20000 RIO DE JANEIRO,RJ,BRAZIL

来源：

THIN SOLID FILMS | 1988年 / 167卷 / 1-2期

关键词：

This work was supportedt hroughg rantsf rom the Board of Regentsa t Texas A & M University; t he TexasA dvancedT echnologyR esearchP rogram( TATRP); theN ational ScienceF oundation( Grant INT 8602288a)n d theC onselhoN ational de DesenvolvimentCo ientificoe Tecnologico( CNPq);

D O I：

10.1016/0040-6090(88)90501-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：245 / 254

页数：10

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