EFFECT OF THE CRITICAL CURRENT CRITERIA ON THE IC VS T RELATION NEAR TC IN POLYCRYSTALLINE Y-BA-CU-O THIN-FILMS

被引:15
作者
LEE, SY
KIM, YH
PARK, JH
CHOI, SS
机构
[1] Superconductor Laboratory, Korea Institute of Science and Technology
关键词
D O I
10.1063/1.103294
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the temperature dependence of the critical current (I c) near Tc for two Y-Ba-Cu-O thin films having zero-dissipation temperature (Tc) of 81 K and a Y-Ba-Cu-O thin film having Tc of 71 K. At temperatures higher than 0.9Tc, the critical current in a voltage criterion of 1 μV/cm appears proportional to (1-T/Tc)n with n≈2, and n≈1.5 in a 10 μV/cm criterion, exhibiting the dependence of n on the critical current criteria. This observation is in contrast with the report of n=1.5 by Ogale et al. [Phys. Rev. B 36, 7210 (1987)], Yuan et al. [J. Appl. Phys. 64, 4091 (1988)], and Horng et al. [Phys. Rev. B 39, 9628 (1989)], implying that n=2, the value for the superconductor-normal metal-superconductor tunneling junction of BCS superconductors near Tc must be taken into consideration to understand the intergrain tunneling process in polycrystalline high T c thin films.
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页码:403 / 405
页数:3
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