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AN ANALYSIS OF ANGULAR DEPENDENT XPS PEAK INTENSITIES
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SURFACE SCIENCE,
1985, 154 (2-3)
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DETERMINATION OF EPITAXIAL OVERLAYER STRUCTURES FROM HIGH-ENERGY ELECTRON-SCATTERING AND DIFFRACTION
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PHYSICAL REVIEW B,
1985, 31 (02)
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STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION
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PHYSICAL REVIEW B,
1985, 32 (08)
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HIGH-TEMPERATURE NUCLEATION AND SILICIDE FORMATION AT THE CO/SI(111)-7X7 INTERFACE - A STRUCTURAL INVESTIGATION
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PHYSICAL REVIEW B,
1986, 34 (02)
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ATOMIC-STRUCTURE OF THE CU/SI(111) INTERFACE BY HIGH-ENERGY CORE-LEVEL AUGER-ELECTRON DIFFRACTION
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PHYSICAL REVIEW B,
1985, 32 (02)
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DIRECT OBSERVATION OF ELASTIC STRAIN AND RELAXATION AT A METAL-METAL INTERFACE BY AUGER-ELECTRON DIFFRACTION - CU/NI(001)
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PHYSICAL REVIEW B,
1986, 33 (12)
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QUANTITATIVE-ANALYSIS OF A SUBMONOLAYER ADSORPTION SYSTEM BY ANGLE RESOLVED XPS - C(2X2)S ON NI(001)
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1984, 2 (03)
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