REAL STRUCTURE OF SINGLE-CRYSTALS AND INTENSITY OF BRAGG-REFLECTIONS

Single-crystal diffractometry can be used to characterize the defect structure of single-crystals up to the level of point defects. This paper deals with the information content of integrated Bragg intensities of weak as well as of fundamental reflections. Experimental possibilities of conventional X-rays and synchrotron radiation are compared. The integrated Bragg intensity is an objective in materials science for the development of high-efficiency monochromators. The importance of beryllium-based materials for new synchrotron and neutron monochromators is discussed and first results are presented.