STATIC SIMS STUDY OF MISCIBLE BLENDS OF POLYSTYRENE AND POLY(VINYL METHYL-ETHER)

被引：29

作者：

BHATIA, QS ^{[1
]}

BURRELL, MC ^{[1
]}

机构：

[1] GE,CORP RES & DEV,MAT CHARACTERIZAT LAB,SCHENECTADY,NY 12301

来源：

SURFACE AND INTERFACE ANALYSIS | 1990年 / 15卷 / 06期

关键词：

D O I：

10.1002/sia.740150608

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Static secondary ion mass spectroscopy (SSIMS) is applied to study the surface of the miscible polystyrene (PS)/poly(vinyl methyl ether) (PVME) blend. The blend surface is enriched with PVME and the enrichment is shown to depend on the composition and molecular weight of the blend constituents. A semi‐quantitative analysis of SSIMS intensities to obtain surface compositions gives good qualitative agreement with previous x‐ray photoelectron spectroscopy (XPS) results. Copyright © 1990 John Wiley & Sons Ltd.

引用

页码：388 / 391

页数：4

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